Applied Materials Israel was granted a patent for synchronized laser sample processing.

{
  "signal_id": "01e43280-e4db-58eb-abd0-354f16525d7b",
  "signal_type": "patents-company",
  "signal_subtype": "patentGrant",
  "detected_at": "2026-09-30T17:29:42+00:00",
  "company": {
    "name": "Applied Materials",
    "domain": "appliedmaterials.com"
  },
  "data": {
    "cpc": [
      {
        "code": "H01J 37/226"
      },
      {
        "code": "H01J 37/265"
      },
      {
        "code": "H01J 37/28"
      },
      {
        "code": "H01J 2237/2817"
      }
    ],
    "tags": [
      "Intellectual Property",
      "Research & Development",
      "Engineering",
      "Manufacturing Operations"
    ],
    "detail": "In September 2026 Applied Materials Israel patented technology for preparing sample regions in electron-beam inspection and analysis systems.",
    "summary": "Applied Materials Israel was granted a patent for synchronized laser sample processing.",
    "event_at": "2026-09-29",
    "inventors": [
      {
        "name": "Roey Levy",
        "status": "unresolved",
        "is_primary": true
      },
      {
        "name": "Shachar Faigenblat",
        "status": "resolved",
        "is_primary": false,
        "linkedin_url": "https://www.linkedin.com/in/shachar-faigenblat-1989293"
      },
      {
        "name": "Alexander Goldenshtein",
        "status": "resolved",
        "is_primary": false,
        "linkedin_url": "https://www.linkedin.com/in/alex-goldenshtein-214a7818"
      }
    ],
    "event_kind": "grant_date",
    "grant_date": "2026-09-29",
    "source_url": "https://patents.google.com/patent/US12749648",
    "cpc_primary": {
      "code": "H01J 37/226"
    },
    "patent_title": "Discharging a region of a sample",
    "patent_number": "US12749648",
    "uspto_assignee": "Applied Materials Israel Ltd.",
    "patent_abstract": "A system for discharging a region of a sample, the system includes (i) illumination optics that is configured to discharge the region by illuminating the region of the sample with a laser pulse during an illumination iteration; and (ii) a timing circuit that is configured to trigger the illumination iteration to occur at a timing that is based on one or more timing constraints associated with a scanning of the region by an electron beam.",
    "precision_class": "structural",
    "invention_explanation": "A timing system fires a laser pulse at a sample region in step with the electron beam scanning it, enabling controlled removal or discharge.",
    "technologies_mentioned": [
      "laser processing",
      "electron-beam inspection",
      "timing circuits",
      "sample preparation"
    ]
  }
}

curl https://signals.autobound.ai/v1/signals/01e43280-e4db-58eb-abd0-354f16525d7b \
  -H "X-API-KEY: $AUTOBOUND_API_KEY"

curl -X POST https://signals.autobound.ai/v1/companies/enrich \
  -H "X-API-KEY: $AUTOBOUND_API_KEY" \
  -H "Content-Type: application/json" \
  -d '{"domain":"appliedmaterials.com","limit":20}'