SK hynix was granted a patent for semiconductor failure-location detection.

{
  "signal_id": "0a387960-41bf-5baf-97f5-636de798a659",
  "signal_type": "patents-company",
  "signal_subtype": "patentGrant",
  "detected_at": "2026-09-30T17:28:16+00:00",
  "company": {
    "name": "SK Hynix",
    "domain": "skhynix.com"
  },
  "data": {
    "cpc": [
      {
        "code": "G11C 29/36"
      },
      {
        "code": "G11C 29/1201"
      },
      {
        "code": "G11C 29/18"
      }
    ],
    "tags": [
      "Intellectual Property",
      "Research & Development",
      "Manufacturing Operations",
      "Quality Assurance"
    ],
    "detail": "In September 2026 SK hynix patented memory-test technology for identifying defective cells and their addresses during semiconductor manufacturing and quality checks.",
    "summary": "SK hynix was granted a patent for semiconductor failure-location detection.",
    "event_at": "2026-09-29",
    "inventors": [
      {
        "name": "Dong Yoon Ka",
        "status": "unresolved",
        "is_primary": true
      }
    ],
    "event_kind": "grant_date",
    "grant_date": "2026-09-29",
    "source_url": "https://patents.google.com/patent/US12749551",
    "cpc_primary": {
      "code": "G11C 29/36"
    },
    "patent_title": "Semiconductor system for detecting fail location",
    "patent_number": "US12749551",
    "uspto_assignee": "SK hynix Inc.",
    "patent_abstract": "A semiconductor device includes a memory circuit including a plurality of mats and configured to output first read data having a data sequence identical to a data sequence of pattern data after the start of a read operation during a test operation mode operation and configured to output a fail address including error information of the first read data, and a data processing circuit configured to output the first read data as data and configured to generate fail location information by encoding the fail address.",
    "precision_class": "structural",
    "invention_explanation": "A memory chip outputs test results with error addresses, while a processing circuit converts them into a map showing where failures occurred.",
    "technologies_mentioned": [
      "semiconductor testing",
      "memory circuits",
      "failure analysis"
    ]
  }
}

curl https://signals.autobound.ai/v1/signals/0a387960-41bf-5baf-97f5-636de798a659 \
  -H "X-API-KEY: $AUTOBOUND_API_KEY"

curl -X POST https://signals.autobound.ai/v1/companies/enrich \
  -H "X-API-KEY: $AUTOBOUND_API_KEY" \
  -H "Content-Type: application/json" \
  -d '{"domain":"skhynix.com","limit":20}'