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SynopsysPatent grant

Synopsys was granted a patent for predicting integrated-circuit performance.

What happened

In September 2026 Synopsys patented statistical modeling software for evaluating circuit designs during semiconductor development and verification.

Source

Abstract

A system and method predicts performance of a circuit design by receiving circuit design training data and circuit design test data. The circuit design training data includes training nodes and training paths. The training paths connect the training nodes including circuit components. The circuit design test data includes a first test node and a second test node. Further, testing information is determined for the circuit components of each training path from the circuit design training data. A statistical representation of the circuit design test data is determined based on the testing information and the circuit design test data, and first test information for a test path connecting the first test node with the second test node is determined based on the statistical representation.

patents.google.com/patent/US12748908Read the full source

Extracted by Autobound

From the Signal API record
Signal
Patent grant

What this signalsA new patent often shows where a company is putting its R&D budget.

Grant date
Sep 29, 2026
Inventors
4
Tech area
software / computing
Patent number
US12748908

The full record

From the Signal API record

People

  • Xiang GaoInventor
  • Hursh NaikInventor
  • Bryan Charles WalshInventor
  • Manish SharmaInventor

Details

Primary CPC class
G06F 30/398 (Electric digital data processing)
USPTO assignee
Synopsys, Inc.
What the invention does
A method that learns from circuit paths and components in past designs to estimate how a new integrated circuit will perform.

Topics and mentions

Tags

  • Intellectual Property
  • Research & Development
  • Engineering
  • Software

Technologies named

  • integrated-circuit design
  • statistical modeling
  • electronic design automation
  • circuit simulation

Extraction

Detected
Sep 30, 2026
signal_type
patents-company
signal_subtype
patentGrant

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This page shows a preview. The full patents-company record in the Signal API and MCP can also have these 8 fields. Some fields are empty for some signals.

Company

  • linkedin_urlValue in the API
  • industriesValue in the API
  • employee_count_lowValue in the API
  • employee_count_highValue in the API
  • revenueValue in the API
  • descriptionValue in the API

Signal

  • signal_nameValue in the API
  • associationValue in the API
Show the full JSONThe record on this page and the API request

GET /v1/signals/5d11cb5c-d759-5ee8-bff9-cca5c0493844 returns this record as JSON. POST /v1/companies/enrich returns every signal for synopsys.com.

{
  "signal_id": "5d11cb5c-d759-5ee8-bff9-cca5c0493844",
  "signal_type": "patents-company",
  "signal_subtype": "patentGrant",
  "detected_at": "2026-09-30T17:20:05+00:00",
  "company": {
    "name": "Synopsys",
    "domain": "synopsys.com"
  },
  "data": {
    "cpc": [
      {
        "code": "G06F 30/398",
        "label": "Electric digital data processing"
      },
      {
        "code": "G06F 30/31",
        "label": "Electric digital data processing"
      },
      {
        "code": "G06F 30/27",
        "label": "Electric digital data processing"
      },
      {
        "code": "G06F 30/3308",
        "label": "Electric digital data processing"
      },
      {
        "code": "G06F 30/367",
        "label": "Electric digital data processing"
      }
    ],
    "tags": [
      "Intellectual Property",
      "Research & Development",
      "Engineering",
      "Software"
    ],
    "detail": "In September 2026 Synopsys patented statistical modeling software for evaluating circuit designs during semiconductor development and verification.",
    "summary": "Synopsys was granted a patent for predicting integrated-circuit performance.",
    "event_at": "2026-09-29",
    "inventors": [
      {
        "name": "Xiang Gao",
        "status": "unresolved",
        "is_primary": true
      },
      {
        "name": "Hursh Naik",
        "status": "resolved",
        "is_primary": false,
        "linkedin_url": "https://www.linkedin.com/in/hurshnaik"
      },
      {
        "name": "Bryan Charles Walsh",
        "status": "unresolved",
        "is_primary": false
      },
      {
        "name": "Manish Sharma",
        "status": "resolved",
        "is_primary": false,
        "linkedin_url": "https://www.linkedin.com/in/manish-sharma-373281b6"
      }
    ],
    "tech_area": "software / computing",
    "event_kind": "grant_date",
    "grant_date": "2026-09-29",
    "source_url": "https://patents.google.com/patent/US12748908",
    "cpc_primary": {
      "code": "G06F 30/398",
      "label": "Electric digital data processing"
    },
    "patent_title": "Statistical graph circuit component probability model for an integrated circuit design",
    "patent_number": "US12748908",
    "uspto_assignee": "Synopsys, Inc.",
    "patent_abstract": "A system and method predicts performance of a circuit design by receiving circuit design training data and circuit design test data. The circuit design training data includes training nodes and training paths. The training paths connect the training nodes including circuit components. The circuit design test data includes a first test node and a second test node. Further, testing information is determined for the circuit components of each training path from the circuit design training data. A statistical representation of the circuit design test data is determined based on the testing information and the circuit design test data, and first test information for a test path connecting the first test node with the second test node is determined based on the statistical representation.",
    "precision_class": "structural",
    "invention_explanation": "A method that learns from circuit paths and components in past designs to estimate how a new integrated circuit will perform.",
    "technologies_mentioned": [
      "integrated-circuit design",
      "statistical modeling",
      "electronic design automation",
      "circuit simulation"
    ]
  }
}

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