US patent US12748908
Statistical graph circuit component probability model for an integrated circuit design
Abstract
A system and method predicts performance of a circuit design by receiving circuit design training data and circuit design test data. The circuit design training data includes training nodes and training paths. The training paths connect the training nodes including circuit components. The circuit design test data includes a first test node and a second test node. Further, testing information is determined for the circuit components of each training path from the circuit design training data. A statistical representation of the circuit design test data is determined based on the testing information and the circuit design test data, and first test information for a test path connecting the first test node with the second test node is determined based on the statistical representation.